Project “Study on Large-scale Surface Topography Measurement White Light Field Scanning Technology”

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[ Instrument Network Instrument Development ] Recently, the results of the National Aeronautical Science Fund project review in 2019 were announced. Dr. Lei Lihua, the mechanical manufacturing institute of Shanghai Institute of Metrology and Testing Technology, announced the “Study on Large-scale Surface Topography Measurement White Light Field Scanning Technology”. Funding, this is the first time that the Shanghai Institute of Metrology and Testing Technology has been approved by the National Aviation Science Fund Laboratory Project.

Shanghai Metrology and Testing Technology Research Institute (SIMT) is one of the earliest established metrological verification professional institutions in China. It is the only legal metrological verification institution authorized by the state in Shanghai, and is also the regional metrology testing center approved by the national metrological administrative department. “East China National Metrology and Testing Center”, the national testing center named by the National Science and Technology Administrative Department, “China Shanghai Testing Center” has gone through more than 80 years.
Founded in 1985, the National Aeronautical Science Fund is one of the main channels for the aviation industry to carry out basic research. It is mainly used to carry out basic research projects in the joint fund for research and development of aviation industry, with emphasis on funding for aviation technology and weaponry development. Basic research and applied basic research on prospects or potential application prospects.
The "Study on Large-Scale Surface Topography Measurement White Light Field Scanning Technology" project is based on the existing traditional white light interferometry device, focusing on the key theory of double-angle white light oblique scanning interferometry, adaptive variable-speed scanning technology and white image interference analysis of single image. The problem is to establish a scanning process model to solve the problem of accurate tracking of surface data points in the scanning process, to break through the limitation of the horizontal measurement field of view of the traditional vertical white light scanning technology, and to improve the rapid measurement and reconstruction capability of large-scale surface topography. The large-scale and high-precision measurement needs in the measurement of aerospace, nano-manufacturing and other industries are conducive to the development and advancement of aviation science and technology.

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