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"Chip-level measurement standard key technology research" implementation plan passed argument
[China Instrument Network Instrument R&D] Recently, the "13th Five-Year Plan" National Key R&D Program "National Quality Based Common Technology Research and Application" Key Project (hereinafter referred to as "NQI Special Project") "Chip Level Measurement Standard Key Technology Research" Project Implementation The program was approved by the China Institute of Metrology (hereinafter referred to as "China Metrology Institute"). Experts from Tsinghua University, China University of Science and Technology, Jilin University, Harbin Institute of Technology, Institute of Oceanography, Chinese Academy of Sciences, Beijing Institute of Tracking and Communications Technology, and leaders of relevant departments of China Institute of Metrology, head of each project and participating units More than 30 people, including the backbone, participated in the demonstration meeting.
Photo of participants: Photo: Chen Hanghang
Jin Guozhen, an academician of the Chinese Academy of Engineering, served as the head of the advisory panel to attend the demonstration. The project leader and the Institute of Time and Frequency Lin Pingwei of China Metrology Institute introduced the overall situation of the project, including the research objectives, research contents, technical routes, assessment indicators, work basis, expected results, implementation mechanisms, and risk countermeasures. Each person in charge of the project introduced the details of the project.
The consultants listened carefully to the report and focused their questions and suggestions on how to reach the predetermined technical indicators. After discussion with the project and the person in charge of the project, the expert group agreed that the project implementation plan passed the demonstration.
According to Lin Pingwei, the project was led by the China Metrology Institute to study chip-level metrology standards in the four key areas of time frequency, temperature, optics and electromagnetism for the imminent major changes in the measurement quantification. The project was implemented in six sub-topics, including the study of atomic clocks for coercive imprisonment, key technologies for temperature measurement of chip-scale Doppler broadening, key technologies for chip-level standard photon radiation sources, and chip-level inter-octave Kerr optical frequency comb characteristics. Key technologies for research and measurement of superconducting quantum interference devices and key technologies for portable quantum resistance standards.
The implementation of this project is expected to enhance the flat-to-scale value transfer capability in time, frequency, optics, temperature, and electromagnetic measurement directions in many fields such as aerospace, power electronics, and nuclear power, and solve technical problems such as online metrology and measurement in extreme environments. To promote the development of related fields.
(Original title: NQI Special Project “Key Technology of Chip Level Metrology Standards†Implementation Plan Passes Demonstration)